M. Fedurco et al., EFFECT OF HALIDE ION ADSORPTION UPON PLASMON-MEDIATED PHOTOELECTRON EMISSION AT THE SILVER SOLUTION INTERFACE/, JOURNAL OF PHYSICAL CHEMISTRY B, 101(26), 1997, pp. 5158-5165
The effect of the roughening of the silver surface upon photoemission
observed in the presence of two different scavengers dissolved in an a
queous solution, CO2 and NO3- ions, was re-examined. The quantum yield
of the photocurrent exhibits a sharp maximum at 370-380 nm in the fre
quency range of surface plasmons on silver. These photoyields were str
ongly affected by the extent of the roughening of the AE surface and r
eached an unusually large value of 0.05 electron per incident photon.
Electrochemical oxidation/reduction roughening performed in the presen
ce of Cl-, Br-, and ClO4- ions, similar to that employed in enhanced R
aman scattering (SERS) experiments, affected the maximum of the photoc
urrent and in some cases also its onset potential, Photocurrents arisi
ng al potentials more negative than the potential of zero charge (pzc)
of silver were principally influenced by changing morphology of the s
urface resulting from more or less deep roughening performed in differ
ent solutions. On the other hand, the photoelectrochemical behavior of
silver at potentials positive with respect to the pzc was clearly aff
ected by the specific adsorption of anions of the supporting electroly
te, It was, Ln particular, the Br- anion that caused in this potential
region the strongest enhancement of the photocurrent, associated with
the reduction of scavengers and led to an apparent positive shift of
the onset potential. The role played by the specifically adsorbed anio
ns is interpreted in terms of slowing down the reverse reactions of so
lvated electrons and of reaction intermediates (such as, for example,
the NO32- anion) returning to the electrode.