Orientation effects on the high-temperature morphological evolution of pore channels in sapphire

Citation
Jd. Powers et Am. Glaeser, Orientation effects on the high-temperature morphological evolution of pore channels in sapphire, J AM CERAM, 83(9), 2000, pp. 2297-2304
Citations number
57
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF THE AMERICAN CERAMIC SOCIETY
ISSN journal
00027820 → ACNP
Volume
83
Issue
9
Year of publication
2000
Pages
2297 - 2304
Database
ISI
SICI code
0002-7820(200009)83:9<2297:OEOTHM>2.0.ZU;2-0
Abstract
Arrays of semi-infinite and of controlled-aspect-ratio pore channels, both of controlled orientation, were introduced into undoped basal-plane sapphir e substrates, using microfabrication techniques, ion-beam etching, and hot pressing. The breakup of these channels via Rayleigh instabilities during a series of annealings at a temperature of 1700 degrees C was monitored. In all cases, the channels broke up with a characteristic wavelength (lambda) that was much larger than that expected for a material with isotropic surfa ce energy, which reflected stabilization effects that were due to anisotrop y of the surface energy. The break-up wavelength also was very dependent on orientation: channels that were oriented along the [1 (1) over bar 00] and [11 (2) over bar 0] directions yielded the smallest and largest pore spaci ngs (X-values), respectively, which is in qualitative agreement with prior observations. The critical (minimum) aspect ratio for the breakup of finite -length channels into multiple pores also is dependent upon channel orienta tion, and the trend mirrors that observed for semi-infinite channels. The p attern of channel evolution suggested two fold rotational symmetry within t he basal plane, where, because of the nature of the experiment, apparent si x-fold symmetry is expected. Several factors that may contribute to or caus e an apparent or real loss of symmetry have been discussed.