EXPERIMENTAL DEMONSTRATION OF DIFFUSION-LIMITED DYNAMICS IN ELECTRODEPOSITION

Citation
C. Leger et al., EXPERIMENTAL DEMONSTRATION OF DIFFUSION-LIMITED DYNAMICS IN ELECTRODEPOSITION, Physical review letters, 78(26), 1997, pp. 5010-5013
Citations number
22
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
78
Issue
26
Year of publication
1997
Pages
5010 - 5013
Database
ISI
SICI code
0031-9007(1997)78:26<5010:EDODDI>2.0.ZU;2-B
Abstract
We present the first quantitative proof of the diffusive character of the mass transport in thin gap electrodeposition experiments. Applying phase-shift interferometry for the local determination of the concent ration held. we demonstrate that the diffusion equation can accurately describe the mass transport in cells whose gap is less than 50 mu m. We also show the correspondence of the time evolution of experimental interfacial depletion profiles along the reacting electrode with theor etical prediction of a simple diffusion equation.