The images of nearest neighbors of gallium atoms in a GaAs crystal were obt
ained by the x-ray fluorescence holography technique. The fluorescence from
gallium atoms was selected by means of a thin zinc foil filter that made p
ossible the use of an x-ray silicon photodiode detector without energy reso
lution. This method makes possible the detection of a much higher signal wi
th respect to all previous experiments, thus reducing drastically measuring
times, that is a basic and essential step from contemporary demonstration
experiments to possible practical applications of x-ray holography in struc
ture analysis.