Ferromagnetic resonance has been used to study the room-temperature linewid
th and frequency shift of the q=0 spin-wave mode in thin films of NiFe sput
tered on Si(100) substrates. The data on the variation of the linewidth and
resonance field with film thickness are completely consistent with the ext
rinsic mechanism recently proposed by Arias and Mills based on momentum non
conserving two-magnon scattering off defects on the film surfaces.