Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application

Citation
M. Ferroni et al., Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application, SENS ACTU-B, 68(1-3), 2000, pp. 140-145
Citations number
16
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
SENSORS AND ACTUATORS B-CHEMICAL
ISSN journal
09254005 → ACNP
Volume
68
Issue
1-3
Year of publication
2000
Pages
140 - 145
Database
ISI
SICI code
0925-4005(20000825)68:1-3<140:SCONNT>2.0.ZU;2-O
Abstract
Pure and Nb-doped TiO2 thick-films were prepared by screen-printing, starti ng from nanosized powders. Grain growth and crystalline phase modification occurred as consequence of firing at high temperature. It has been shown th at niobium addition inhibits grain coarsening and hinders anatase-to-rutile phase transition. These semiconducting films exhibited n-type behavior, wh ile Nb acted as donor-dopant. Gas measurements demonstrated that the films are suitable for CO or NO2 sensing. Microstructural characterization by ele ctron microscopy and differential thermal analysis (DTA) highlights the dep endence of gas-sensing behavior on film's properties. (C) 2000 Elsevier Sci ence S.A. All rights reserved.