Contactless photovoltage method for measurement of diffusion length of minority carriers in solar cells

Citation
J. Tousek et al., Contactless photovoltage method for measurement of diffusion length of minority carriers in solar cells, SOL EN MAT, 64(1), 2000, pp. 29-35
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
SOLAR ENERGY MATERIALS AND SOLAR CELLS
ISSN journal
09270248 → ACNP
Volume
64
Issue
1
Year of publication
2000
Pages
29 - 35
Database
ISI
SICI code
0927-0248(20000901)64:1<29:CPMFMO>2.0.ZU;2-3
Abstract
Contactless photovoltage method is presented as a generalization of convent ional surface photovoltage investigation of semiconductor parameters. Exist ence of two space charge regions causing two signals of opposite sign was t aken into account and calculated photovoltage was compared with experimenta l data. The method has been used for evaluation of parameters of silicon so lar cells. (C) 2000 Elsevier Science B.V. All rights reserved.