The combination of electrodeposited Cu-Se alloy and sputtered In precursors
, followed by annealing in Se atmosphere, was found successful to obtain Cu
InSe2, thin films with Cu/In composition ratios varying between 0.25 and 2.
75. Structural and morphological properties were observed to be dependent o
n annealing temperature and Cu/In ratio. When Cu/In > 1, both a CuInSe2, cr
ystallinity improvement and a smooth surface were achieved. Apart from the
ternary CuInSe2, two different binaries were detected: Cu2Se crystallises a
fter 400 degrees C annealing in samples with Cu/In > 1, and In2Se3 does aft
er annealing at 500 degrees C for the distinct Cu/In ratios considered. (C)
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