U. Rammelt et Ca. Schiller, Impedance studies of layers with a vertical decay of conductivity or permittivity, ACH-MODEL C, 137(2-3), 2000, pp. 199-212
Several types of dielectric layers on metals were investigated. It was obse
rved that not only the CPE capacitance bur also the CPE exponent alpha chan
ge if the thickness of the oxide layer, the thickness of the space charge l
ayer or the penetration depth of water into an organic coating is changed.
This behavior agrees with the predictions resulting from the theory of Youn
g. The Young impedance can be considered as a more general model than the C
PE for the description of the behavior of metals covered by dielectric laye
rs. The measured frequency dependence of the phase angle phi can be explain
ed with an exponential distribution of conductivity and/or permittivity acr
oss the dielectric layer perpendicular to the surface. If cp is nearly inde
pendent of frequency, the impedance response can be approximated by a simpl
e CPE.