Reduction of mass bias and matrix effects in inductively coupled plasma mass spectrometry with a supplemental electron source in a negative extraction lens

Citation
N. Praphairaksit et Rs. Houk, Reduction of mass bias and matrix effects in inductively coupled plasma mass spectrometry with a supplemental electron source in a negative extraction lens, ANALYT CHEM, 72(18), 2000, pp. 4435-4440
Citations number
15
Categorie Soggetti
Chemistry & Analysis","Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ANALYTICAL CHEMISTRY
ISSN journal
00032700 → ACNP
Volume
72
Issue
18
Year of publication
2000
Pages
4435 - 4440
Database
ISI
SICI code
0003-2700(20000915)72:18<4435:ROMBAM>2.0.ZU;2-L
Abstract
Electrons from a heated tungsten filament are created inside the extraction lens and driven out toward the skimmer. These electrons move through the i on path and reduce space charge effects between positive ions in the beam. The ion transmission efficiency is improved by factors of two (for Pb+) to 27 (for Li+). The greater sensitivity improvement for low-mass ions leads t o a substantial reduction in mass bias. With the additional electrons, MO+/ M+ and M2+/M+ abundance ratios increase but can be minimized with a small r eduction in aerosol gas now rate. No new background ions are observed with this technique. Matrix effects can be significantly diminished when the ele ctron source is operated under the high electron current mode. The mass dep endence of matrix-induced suppression of analyte signals is essentially eli minated. Using now injection analysis to minimize solid deposition, the tec hnique can tolerate Na matrix up to 10 000 ppm (1%) with only similar to 15 % loss of analyte sensitivity.