Reduction of mass bias and matrix effects in inductively coupled plasma mass spectrometry with a supplemental electron source in a negative extraction lens
N. Praphairaksit et Rs. Houk, Reduction of mass bias and matrix effects in inductively coupled plasma mass spectrometry with a supplemental electron source in a negative extraction lens, ANALYT CHEM, 72(18), 2000, pp. 4435-4440
Electrons from a heated tungsten filament are created inside the extraction
lens and driven out toward the skimmer. These electrons move through the i
on path and reduce space charge effects between positive ions in the beam.
The ion transmission efficiency is improved by factors of two (for Pb+) to
27 (for Li+). The greater sensitivity improvement for low-mass ions leads t
o a substantial reduction in mass bias. With the additional electrons, MO+/
M+ and M2+/M+ abundance ratios increase but can be minimized with a small r
eduction in aerosol gas now rate. No new background ions are observed with
this technique. Matrix effects can be significantly diminished when the ele
ctron source is operated under the high electron current mode. The mass dep
endence of matrix-induced suppression of analyte signals is essentially eli
minated. Using now injection analysis to minimize solid deposition, the tec
hnique can tolerate Na matrix up to 10 000 ppm (1%) with only similar to 15
% loss of analyte sensitivity.