The properties of ferroelectric films at small dimensions

Citation
Tm. Shaw et al., The properties of ferroelectric films at small dimensions, ANN R MATER, 30, 2000, pp. 263-298
Citations number
169
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
ANNUAL REVIEW OF MATERIALS SCIENCE
ISSN journal
00846600 → ACNP
Volume
30
Year of publication
2000
Pages
263 - 298
Database
ISI
SICI code
0084-6600(2000)30:<263:TPOFFA>2.0.ZU;2-M
Abstract
This paper reviews the literature on size effects in ferroelectric material s, with an emphasis on thin film perovskite ferroelectrics. The roles of bo undary conditions, defect chemistry, electrode interfaces, surface layers, and microstructure in controlling the measured properties of ferroelectric films, as well as the observed deviation from bulk properties are discussed . Examples of the manifestation of size effects in terms of the low and hig h field dielectric properties, the piezoelectric effect, and the leakage be havior of films are given.