Polysilicon surface micromachining is advancing significantly and many new
applications are moving beyond the prototyping phase. Recent technical succ
esses are leading to excitement concerning various uses of devices in optic
al, wireless, sensor, and many other areas. Incorporation of state-of-the-a
rt integrated circuit (IC) fabrication methods, such as planarization by ch
emical mechanical polishing (CMP), has enabled extension to a five-level te
chnology. This has opened significant design space, especially for microact
uator applications. Recent advancement of in situ microdiagnostics for mate
rials and surface properties has enhanced our understanding of device relia
bility and performance and will allow devices to operate near well-known ma
terials limits. New IC-compatible materials will further enhance the capabi
lities of microsystems in terms of performance, reliability, and operation
in harsh environments.