IC-compatible polysilicon surface micromachining

Citation
Jj. Sniegowski et Mp. De Boer, IC-compatible polysilicon surface micromachining, ANN R MATER, 30, 2000, pp. 299-333
Citations number
104
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
ANNUAL REVIEW OF MATERIALS SCIENCE
ISSN journal
00846600 → ACNP
Volume
30
Year of publication
2000
Pages
299 - 333
Database
ISI
SICI code
0084-6600(2000)30:<299:IPSM>2.0.ZU;2-1
Abstract
Polysilicon surface micromachining is advancing significantly and many new applications are moving beyond the prototyping phase. Recent technical succ esses are leading to excitement concerning various uses of devices in optic al, wireless, sensor, and many other areas. Incorporation of state-of-the-a rt integrated circuit (IC) fabrication methods, such as planarization by ch emical mechanical polishing (CMP), has enabled extension to a five-level te chnology. This has opened significant design space, especially for microact uator applications. Recent advancement of in situ microdiagnostics for mate rials and surface properties has enhanced our understanding of device relia bility and performance and will allow devices to operate near well-known ma terials limits. New IC-compatible materials will further enhance the capabi lities of microsystems in terms of performance, reliability, and operation in harsh environments.