The development of a versatile tool to quantify magnetic anisotropies in co
ntinuous and patterned magnetic thin films is reported. The technique invol
ves measuring the magnetooptic response to a rotating magnetic field. Simil
arly to mechanical torque techniques, a single measurement obtains both the
anisotropy constants and their symmetry axes distribution. The technique h
as been applied to analyze arrays of submicrometer stripe-shaped Fe (001) e
lements with different interelement separations (s). For s larger than 1 mu
m, the anisotropy associated with the stripes is independent on separation
, with a value of the effective uniaxial anisotropy constant very consisten
t with theoretical estimations for these systems. (C) 2000 American Institu
te of Physics. [S0003-6951(00)05637-0].