Differential electronic gating: A method to measure the shape of short THzpulses with a poorly defined trigger signal

Citation
Jn. Hovenier et al., Differential electronic gating: A method to measure the shape of short THzpulses with a poorly defined trigger signal, APPL PHYS L, 77(12), 2000, pp. 1762-1764
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
12
Year of publication
2000
Pages
1762 - 1764
Database
ISI
SICI code
0003-6951(20000918)77:12<1762:DEGAMT>2.0.ZU;2-F
Abstract
A simple experimental method has been developed to determine the shape of r epetitive picosecond THz pulses in the presence of a large jitter in the tr igger signal. This method, a modification of the recently reported differen tial optical gating method, is based on the femtosecond electronic gating o f a high-frequency sequential oscilloscope. As a test, the shape of THz pul ses from the free-electron laser has been measured. (C) 2000 American Insti tute of Physics. [S0003-6951(00)03738-4].