Citation
M. Gessel et al., Detection of faults in combinational circuits by a self-dual test, AUT REMOT R, 61(7), 2000, pp. 1192-1200
Citations number
4
Categorie Soggetti
AI Robotics and Automatic Control
Journal title
AUTOMATION AND REMOTE CONTROL
ISSN journal
00051179
→ ACNP
Volume
61
Issue
7
Year of publication
2000
Part
2
Pages
1192 - 1200
Database
ISI
SICI code
0005-1179(200007)61:7<1192:DOFICC>2.0.ZU;2-1
Abstract
A new functional test, called the self-dual test, for combinational circuit
s is designed.