All-optical high-frequency characterization of optical devices for optomicrowave applications

Citation
Jf. Roux et al., All-optical high-frequency characterization of optical devices for optomicrowave applications, IEEE PHOTON, 12(8), 2000, pp. 1031-1033
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE PHOTONICS TECHNOLOGY LETTERS
ISSN journal
10411135 → ACNP
Volume
12
Issue
8
Year of publication
2000
Pages
1031 - 1033
Database
ISI
SICI code
1041-1135(200008)12:8<1031:AHCOOD>2.0.ZU;2-I
Abstract
In this letter, we present an original method to investigate the frequency response of optomicrowave devices in the GHz-THz range. In order to reach s uch a high bandwidth, we take advantage of the wide spectrum associated wit h femtosecond laser pulses, Using nonlinear crosscorrelation optical techni que under appropriate conditions, the transfer function of a device is deri ved from its measured impulse response. We experimentally demonstrate our m ethod by testing an integrated Mach-Zehnder interferometer, which acts as a notch filter for modulation frequencies that are odd multiples of 15 GHz.