Effect of rare-earth oxide(CeO2) on the microstructures in laser melted layer

Citation
Ym. Zhang et al., Effect of rare-earth oxide(CeO2) on the microstructures in laser melted layer, J MATER SCI, 35(21), 2000, pp. 5389-5400
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
35
Issue
21
Year of publication
2000
Pages
5389 - 5400
Database
ISI
SICI code
0022-2461(200011)35:21<5389:EOROOT>2.0.ZU;2-O
Abstract
The effect of rare-earth oxide (CeO2) on the microstructures in laser melte d layer has been studied via X-ray diffraction analysis and transmission el ectron microscopy techniques. It is shown that in the laser melted layer, t he primary crystallization gamma -(Fe,Ni) phase is changed from 3.0 mu m to 1.5 mu m in average size after the addition of rare-earth oxide; while in the eutectic structure, granular CeNi8Si5 phase is identified in the CeO2-a ddition sample except for the primary crystallization gamma -(Fe,Ni) phase and laminar Fe3B phase which appear in the CeO2-free sample. Electron micro scopical evidences show that quantities of W-rich phases with the molecular formula of (Cr,W)(7)C-3, are found in the CeO2-addition sample, it is of o rthorhombic structure with lattice parameters of a = 0.494 nm, b = 0.732 nm , c = 1.355 nm. (C) 2000 Kluwer Academic Publishers.