Silica glasses implanted with 2 MeV Cu+ ions at various doses from 9.95x10(
16) to 2.2x10(17) ions/cm(2) were thermally annealed in air in between 600
degrees C and 1050 degrees C. Rutherford backscattering measurements were u
sed to determine the concentration of implanted ions and their distribution
s in the samples. The Cu distribution in the samples depended on the implan
tation dose. Optical absorption spectra, measured in between 200 and 800 nm
at room temperature, revealed a peak at about 560 nm, attributed to colloi
dal Cu particles, for all the samples even before heat treatment, which ind
icates the formation of particles even at lower doses, when high energy imp
lantation is used. Using the equation derived from the framework of free-el
ectron theory, the average radii of the Cu particles were determined from t
he experimental surface plasmon absorption peaks. The average radius of Cu
particles decreased slightly on annealing at 600 degrees C, suggesting the
formation of additional small Cu precipitates at this temperature. However,
the average radius of Cu particles increased as the annealing temperature
increased from 800 degrees C to 1050 degrees C. The anomalies between the c
alculated average radius of the particles and the absorption peak positions
at higher annealing temperatures were explained. (C) 2000 Elsevier Science
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