XPS, NMR and FTIR structural characterization of polysiloxane-immobilized amine ligand systems

Authors
El Nahhal, IM Chehimi, MM Cordier, C Dodin, G
Citation
Im. El Nahhal et al., XPS, NMR and FTIR structural characterization of polysiloxane-immobilized amine ligand systems, J NON-CRYST, 275(1-2), 2000, pp. 142-146
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF NON-CRYSTALLINE SOLIDS
ISSN journal
00223093 → ACNP
Volume
275
Issue
1-2
Year of publication
2000
Pages
142 - 146
Database
ISI
SICI code
0022-3093(200009)275:1-2<142:XNAFSC>2.0.ZU;2-I
Abstract
The polysiloxane-immobilized monoamine ligand systems were made by hydrolyt ic polycondensation of Si(OEt)(4) and (EtO)(3)Si(CH2)(3)NH2. These material s were examined by XPS, FTIR and NMR techniques. The analysis indicates tha t the amine ligand groups almost exist in the free form in the alkaline med ia and in the cation form in the acid media. C-13 NMR and FTIR spectra comb ined with the XPS results shows that there is some leaching of small oligom eric ligand containing groups from the siloxane network. (C) 2000 Elsevier Science B.V. All rights reserved.