Space and angular dependence of interface currents in the multiband-CCCP method

Citation
H. Tatsumi et al., Space and angular dependence of interface currents in the multiband-CCCP method, J NUC SCI T, 37(7), 2000, pp. 572-580
Citations number
19
Categorie Soggetti
Nuclear Emgineering
Journal title
JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY
ISSN journal
00223131 → ACNP
Volume
37
Issue
7
Year of publication
2000
Pages
572 - 580
Database
ISI
SICI code
0022-3131(200007)37:7<572:SAADOI>2.0.ZU;2-0
Abstract
The present pal,cr discusses the effect on accuracy of eigenvalue by the de gree of discretization at the cell boundary within the framework of the mul tiband-CCCP, a combination of the multiband method and the CCCP method. A s tudy oil sensitivity of discretization has been done concerning the depende nce of surface flux distribution in space and angular domain, or interface currents. It is found that appropriate discretization with more than five f or both uf segments and sectors is required to accurately calculate effecti ve cross sections and eigenvalue in the multiband-CCCP method. However, in practice, discretization schemes with one segment and several sectors can b e employed with some biases on eigenvalue. The distribution of surface flux at the boundary of a typical PWR-MOX cell has been studied. It is found that discontinuity and strong angular depende nce in the distribution of surface flux on the off-centered segments have l arge influence in the multiband-CCCP method. An improved scheme of angular discretization has been examined for the feasibility to retain calculation accuracy with less degree of discretization in angular domain.