Optical properties of CdSe films deposited by the quasi-closed volume technique

Polycrystalline CdSe thin films (d = 0.08-1.65 mu m) have been prepared by the quasi-closed volume technique under vacuum on glass substrates. The fil m structure was studied by the x-ray diffraction technique and atomic force microscopy. The values of the optical parameters (refractive index, n, and absorption c oefficient, alpha) were determined from transmission spectra. The optical e nergy gap for the obtained CdSe films was also determined. The influence of deposition conditions (substrate temperature, evaporation source temperatu re) on the values of optical parameters is investigated.