Mode-dependent toughness and the delamination of compressed thin films

Authors
Citation
B. Audoly, Mode-dependent toughness and the delamination of compressed thin films, J MECH PHYS, 48(11), 2000, pp. 2315-2332
Citations number
32
Categorie Soggetti
Mechanical Engineering
Journal title
JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS
ISSN journal
00225096 → ACNP
Volume
48
Issue
11
Year of publication
2000
Pages
2315 - 2332
Database
ISI
SICI code
0022-5096(200011)48:11<2315:MTATDO>2.0.ZU;2-2
Abstract
We consider the buckle-driven delamination of compressed thin films. For a wide class of patterns of delamination, it is shown that the loading on the delamination front progressively goes from mode I to mode II during growth of the blister. As a result, the mode dependence of the film/substrate int erface excludes widespread delamination. This explains the observations of blisters of finite extent, which are otherwise difficult to interpret. We a lso study a model of interfacial fracture with friction. It reveals that a severe mode dependence can be induced by interfacial friction. This permits us to account for the mode dependence using only simple ingredients: frict ion and linear elasticity. (C) 2000 Elsevier Science Ltd. All rights reserv ed.