Microstructures in advanced materials characterized by HREM and nanoscale analysis

Citation
Dx. Li et al., Microstructures in advanced materials characterized by HREM and nanoscale analysis, MATER CHAR, 44(4-5), 2000, pp. 391-402
Citations number
14
Categorie Soggetti
Material Science & Engineering
Journal title
MATERIALS CHARACTERIZATION
ISSN journal
10445803 → ACNP
Volume
44
Issue
4-5
Year of publication
2000
Pages
391 - 402
Database
ISI
SICI code
1044-5803(200004/05)44:4-5<391:MIAMCB>2.0.ZU;2-W
Abstract
Segregation of yttrium induces the formation of Y0.25Zr0.75O2-x and Y0.5Zr0 .5O2-y microdomains, with L1(2)- and L1(0)-like ordered structures, in ZrO2 -6mol%Y2O3 ceramics in both the sintered and annealed states. The compositi ons of precipitates such as (chi L), (chi S), (chi SS), and small precipita tes formed inside XL, in Cu-11.88Al-5.06Ni-1.63Mn-0.96Ti (wt.%) shape memor y alloys have been determined. Under electron beam irradiation, four types of dynamic behavior of the G.P. zones were observed in the Al-6.58Zn-2.33Mg -2.40Cu (wt.%) alloy. The G.P. zone and "G.P. zone-like" defect structures were also distinguished. Lattice distortion profile in the GaAs/InxGa1-xAs superlattice and two-dimensional lattice distortion around a 60 degrees dis location core in the InAs(x)P(1-)x/InP superlattice were determined. (C) El sevier Science Inc., 2000. All rights reserved.