Gj. Klap et al., Absolute configuration and domain structure of AlPO4-5 studied by single crystal X-ray diffraction, MICROP M M, 38(2-3), 2000, pp. 403-412
The absolute configuration of AlPO4-5 has been determined from single cryst
al X-ray diffraction data. The intensities of Friedel related reflections w
ere measured at room temperature from a microcrystal (maximum size similar
to 50 mu m) using synchrotron radiation (lambda = 1.46 Angstrom) and at 100
K from a larger crystal (similar to 250 mu m) using radiation from a seale
d Cu tube (lambda = 1.5418 Angstrom). Both data sets indicate the same abso
lute configuration. The Al(O)P vector, parallel to the polar channel axis,
points along the main growth direction. Perpendicular to the main growth di
rection, the crystal is terminated by an Al(O)P plane with the Al atoms at
the surface.
The crystal structure of AlPO4-5, a = b = 13.718(1) Angstrom, c = 8.4526(5)
Angstrom, and gamma = 120.00 degrees, is described as consisting of three
types of microdomains, each exhibiting P6 symmetry. The domains are related
by two sets of glide planes. The average structure has P6cc symmetry. All
observed angles and distances are within acceptable limits: P-O = 1.50-1.57
Angstrom, Al-O = 1.69-1.76 Angstrom, O-P-O = 104-119 degrees, O-Al-O = 99-
124 degrees and Al-O-P = 137-154 degrees. The observed tweak) diffuse scatt
ering might be caused, besides, the disorder of the template molecules, by
incoherent scattering of domain walls, which exhibit geometries slightly di
fferent from each of the three domains. (C) 2000 Elsevier Science B.V. All
rights reserved.