Silicalite-1 films grown on gold surfaces seeded with colloidal crystals wi
th a size of 60, 165 and 320 nm were investigated by reflection-absorption
infrared spectroscopy, scanning electron microscopy and X-ray diffraction i
n order to follow up the formation of nano-scale defects and to determine t
he optimal synthesis conditions for preparation of silicalite-1 films with
a low concentration of defects. Using 60-nm-sized colloidal crystals, the s
eeding method was capable of producing silicalite-1 films with low concentr
ations of defects and with thicknesses ranging from 100 to 300 nm, which ar
e predominantly oriented with the a-axis perpendicular to the surface. Hydr
othermal treatment times of the 60-nm-seeded surfaces longer than 36 h as w
ell as the seeding with 165 or 320 nm colloidal crystals substantially enha
nced the formation of defects in the films. (C) 2000 Elsevier Science B.V.
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