Structural analysis of the layered compounds CuxTiS2

A structural analysis of single crystals of the layered compounds CuxTiS2 ( x=0, 0.21 and 0.38), which were prepared by the iodine transport and the el ectrochemical methods, has been performed by X-ray diffraction. The displac ement parameters of Ti and S atoms along the c axis are larger than those a long the a axis. It is understood that the intra-layer bonding between Ti-T i and S-S atoms is stronger than the inter-layer bonding between Ti- and S- layers. Both distances between Ti- and S-layers and between Cu- and S-layer s are enlarged without changing the structure of the mother phase after int ercalating Cu atoms.