Vs. Serbesov et al., MODIFICATION OF THE PROPERTIES OF HTSC YBCO THIN-FILMS ON SILICON BY SUPERFAST LASER ANNEALING IN OXYGEN WITH A CW CO2-LASER, Journal of materials science. Materials in electronics, 5(5), 1994, pp. 272-274
The use of superfast CW CO2 laser annealing in O2 for modifying the pr
operties of laser deposited Y1Ba2Cu3O7-x thin films is described. The
film resistivity could be controlled reversibly by laser irradiation a
t 40 WCM-2. The resistivity was measured in situ during the annealing
process.