Development and application of reflection high-energy positron diffraction

Citation
A. Kawasuso et al., Development and application of reflection high-energy positron diffraction, NUCL INST B, 171(1-2), 2000, pp. 219-230
Citations number
34
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
171
Issue
1-2
Year of publication
2000
Pages
219 - 230
Database
ISI
SICI code
0168-583X(200008)171:1-2<219:DAAORH>2.0.ZU;2-P
Abstract
Reflection high-energy positron diffraction (RHEPD) has been utilized using a 20 keV positron beam generated by an electrostatic beam apparatus. The s tructure of a hydrogen-terminated Si(1 1 1) surface has been analyzed from the rocking curves with dynamical calculation. Residual surface roughness o bserved after the hydrogen-termination was explained as the presence of SiH 3 molecule on monohydride surface. Reflectivities of positrons at Au, Ni an d Ir(0 0 1) surfaces have been measured as a function of positron energy no rmal to surface. Abrupt decreases in the reflectivities were observed in th e total reflection region of positrons, which are possibly associated with the surface dipole barriers. (C) 2000 Elsevier Science B.V. All rights rese rved.