TIME-FREQUENCY MODELING OF ATOMIC-FORCE MICROSCOPY

Authors
DRAGOMAN D DRAGOMAN M
Citation
D. Dragoman et M. Dragoman, TIME-FREQUENCY MODELING OF ATOMIC-FORCE MICROSCOPY, Optics communications, 140(4-6), 1997, pp. 220-225
Citations number
13
Categorie Soggetti
Optics
Journal title
Optics communications → ACNP
ISSN journal
00304018
Volume
140
Issue
4-6
Year of publication
1997
Pages
220 - 225
Database
ISI
SICI code
0030-4018(1997)140:4-6<220:TMOAM>2.0.ZU;2-7
Abstract
Atomic force microscopy is modeled in the time-frequency phase space. In this phase space it is equivalent to a succession of temporal lense s and free spaces which includes a temporal fractional Fourier device. Then, the Wigner transform and its second order moments are introduce d to model the atomic forte microscopy as a detector of ultrafast elec trical signals. (C) 1997 Elsevier Science B.V.