LATERAL PHOTODETECTORS ON ARROW STRUCTURES FOR OPTICAL INTERCONNECTIONS

The leakage of light from an Anti-Resonant Radiative Optical Waveguide to a thin film photodiode grown on its surface is analyzed using a Tr ansfer Matrix method. As a result we identify the critical parameters of the system geometry to obtain, for a given set of materials, a maxi mum of response in the photodiode. We propose the design of an ARROW w aveguide with a lateral photodetector, compatible with silicon technol ogy, for optical interconnects and optical integrated sensors on silic on. (C) 1997 Elsevier Science B.V.