Influence of the mesa size on Ge island electroluminescence properties

Citation
O. Chretien et al., Influence of the mesa size on Ge island electroluminescence properties, SEMIC SCI T, 15(9), 2000, pp. 920-925
Citations number
35
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
ISSN journal
02681242 → ACNP
Volume
15
Issue
9
Year of publication
2000
Pages
920 - 925
Database
ISI
SICI code
0268-1242(200009)15:9<920:IOTMSO>2.0.ZU;2-Y
Abstract
The influence of the mesa size on the structural and luminescence propertie s of Ge island layers deposited by low-pressure chemical vapour deposition was studied. Diode structures containing one Ge island layer were grown sel ectively on patterned wafers with variable area. The analysis shows that th e electroluminescence spectra could be separated into three contributions l ying at low-, medium and high-energy positions, respectively. The absolute peak intensity of each signal depends on the mesa size and on the injected current density. The signal at the low-energy position was assigned to an e ffect due to the facets of the diodes; the two other signals originate from islands on the (001) plane having different Si contents or strain states o n the (001) plane.