Surface chemistry of end cuts from Athabasca bitumen

Bitumen components, responsible for various processing problems, were analy sed with x-ray photoelectron spectroscopy (XPS), time-of-flight secondary i on mass spectrometry (ToF-SIMS) and photoacoustic Fourier transform infrare d spectrometry (PAS-FTIR), These methods were selected because they can pro be surfaces to different depths: ToF-SIMS explores the surface to a depth o f similar to 1 nm; XPS analyses a surface layer 7 nm deep; and PAS-FTIR pro bes layers several micrometres thick. Copyright (C) 2000 John Wiley & Sons, Ltd.