S. Tanuma et al., Estimation of surface excitation correction factor for 200-5000 eV in Ni from absolute elastic scattering electron spectroscopy, SURF INT AN, 30(1), 2000, pp. 212-216
We have determined the surface plasmon excitation correction (SEC) factor f
or nickel in the 200-5000 eV range from the ratios of the absolute elastic
scattering electron intensities measured by a novel cylindrical mirror anal
yser and those by the Monte Carlo method. The inelastic mean free paths (IM
FPs) of nickel used for the Monte Carlo method in the energy range specifie
d were calculated by the Penn algorithm. The resulting SECs were smaller th
an the values calculated from Chen and Oswald general equations of surface
excitation parameters (SEPs), which describe the influence of surface plasm
on excitations by electrons crossing a solid surface. We also found that SE
Ps (obtained from SECs) could be fitted to the equation P-s(alpha, E) = C/[
E-n cos(alpha) + C] or P-s(alpha, E) = aE(-b)/cos(alpha) (<7% root-mean-squ
are error) in the 200-5000 eV energy range, where P-s is the SEP, alpha is
the surface crossing angle of the electron to the surface normal, n(= 0.41)
, C(= 5.39), a(= 1.7) and b(= 0.29) are parameters and E is the electron en
ergy. Copyright (C) 2000 John Wiley & Sons, Ltd.