TEY-XANES spectra of chromium thin films on iron measured with grazing incident synchrotron radiation

Total electron yield (TEY) x-ray absorption near-edge structure (XANES) spe ctra were measured with grazing incident synchrotron radiation for Cr thin films on Pe in order to investigate the feasibility of the technique for su rface analysis, The minimum detection depth of TEY-XANES with the grazing i ncident x-rays is 2-20 nm for the Cr films studied. The spectral shapes of both Cr K-edge and Fe K-edge spectra are changed at incident angles between 0.1 degrees and 3-5 degrees. These results are discussed by x-ray absorpti on depths, electron penetration lengths and total reflection in terms of th e applicability of TEY-XANES with grazing incident x-rays for chemical-stat e analysis of material surfaces. Copyright (C) 2000 John Wiley & Sons, Ltd.