Thin film analysis of chromium-phosphate conversion coatings on aluminium probed by ToF-SIMS and electron probe x-ray analysis

Authors
Cuynen, E Goeminne, G Van Espen, P Terryn, H
Citation
E. Cuynen et al., Thin film analysis of chromium-phosphate conversion coatings on aluminium probed by ToF-SIMS and electron probe x-ray analysis, SURF INT AN, 30(1), 2000, pp. 589-591
Citations number
8
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE AND INTERFACE ANALYSIS
ISSN journal
01422421 → ACNP
Volume
30
Issue
1
Year of publication
2000
Pages
589 - 591
Database
ISI
SICI code
0142-2421(200008)30:1<589:TFAOCC>2.0.ZU;2-G
Abstract
Time-of-flight SIMS was used to study chromium phosphate conversion layers on Al. During coating formation, fluorine is buried under a layer of CrPxOy as the layer thickens, yielding a duplex layer structure. Electron probe x -ray microanalysis was used to assess the variation in elemental compositio n of the coating, Preliminary results demonstrate a number of problems rela ted to quantitative analysis of the coatings studied. Copyright (C) 2000 Jo hn Wiley & Sons, Ltd.