Structural and spectroscopic characterizations of oligoaniline thin films

Citation
B. Corraze et al., Structural and spectroscopic characterizations of oligoaniline thin films, THIN SOL FI, 372(1-2), 2000, pp. 54-59
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
372
Issue
1-2
Year of publication
2000
Pages
54 - 59
Database
ISI
SICI code
0040-6090(20000822)372:1-2<54:SASCOO>2.0.ZU;2-7
Abstract
In this work, we describe the elaboration of thin films of vacuum deposited N,N'-diphenyl-1,4-phenylenediamine. In the first part, we discuss the infl uence of the different parameters used during the deposition process, leadi ng to different structures of the films. Then, several characterizations of these thin films are presented. The morphology as well as the topography o f the film surface has been investigated by scanning electron and atomic fo rce microscopes. X-Ray diffraction has also given some interesting informat ion on the structural organization of our films. In the last step, we have determined the optical and vibrational properties of these thin films by UV -Vis-NIR absorption and by Raman and infrared spectroscopies. In each case, our results are correlated to those of the well-known solid form of N,N'-d iphenyl-1,4-phenylenediamine, which have been extensively studied. (C) 2000 Elsevier Science S.A. All rights reserved.