Physical properties of thermal coating CdS thin films using a modified evaporation source

Citation
Sa. Mahmoud et al., Physical properties of thermal coating CdS thin films using a modified evaporation source, THIN SOL FI, 372(1-2), 2000, pp. 144-148
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
372
Issue
1-2
Year of publication
2000
Pages
144 - 148
Database
ISI
SICI code
0040-6090(20000822)372:1-2<144:PPOTCC>2.0.ZU;2-C
Abstract
Thin films of CdS on glass substrates have been prepared by a thermal evapo ration technique using a modified evaporation source under different prepar ation conditions. The structural features have been investigated using XRD. The current density-voltage characteristics have been investigated at room temperature with different thicknesses. The results showed ohmic conductio n in the lower voltage range and space-charge limited conduction controlled by a single-discrete trapping level for a higher voltage section. Analyses of the results yielded important dependence of film thickness on both the thermally-generated electron concentration and the trapping factor. The opt ical parameters have been calculated. The dependence of the refractive inde x, n, and extinction coefficient, k, on the wavelength for a prepared sampl e is also reported. (C) 2000 Elsevier Science S.A. All rights reserved.