The roles of EBIC, OBIC (LBIC), spatially resolved spectral response and ca
thodoluminescence in determining the influence of grain boundaries in the C
dTe/CdS solar cell are critically reviewed. Conventional use of EBIC in the
determination of junction position and L-e in thin films is assessed. Dire
ct evidence of grain boundary passivation from front-wall (illumination geo
metry) OBIC and EBIC is described. The use of non-standard injection-depend
ent EBIC to probe near grain boundary doping, and a model of grain boundary
passivation is outlined. New results of the use of cathodoluminescence mic
roscopy to probe individual grains are presented and discussed with regard
to passivation. (C) 2000 Elsevier Science S.A. All rights reserved.