Optical and structural properties of two-sourced evaporated ZnTe thin films

Authors
Aqili, AKS Ali, Z Maqsood, A
Citation
Aks. Aqili et al., Optical and structural properties of two-sourced evaporated ZnTe thin films, APPL SURF S, 167(1-2), 2000, pp. 1-11
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
167
Issue
1-2
Year of publication
2000
Pages
1 - 11
Database
ISI
SICI code
0169-4332(20001016)167:1-2<1:OASPOT>2.0.ZU;2-0
Abstract
Optical properties of ZnTe films, deposited by thermal evaporation of Zn an d Te sources, were studied in the range of 400-2000 nm by UV-VIS-NIR spectr ophotometer. Variations of refractive index with incident photon energy are fitted to a single oscillator model. Optical band gap and X-ray diffractio n (XRD) have been reported for ZnTe films formed at substrate temperature o f 300 degrees C with different evaporation rates. (C) 2000 Elsevier Science B.V. All rights reserved.