We study the surface structure of Sb-terminated singular (on-axis) and vici
nal (4 degrees offcut in [110]) Si(001) by Raman spectroscopy (RS). In the
Raman spectra three surface phonons with A(1)-symmetry are identified at 80
cm(-1), 130.5 cm(-1) and 162 cm(-1). The polarisation dependent Raman scat
tering intensities for the singular and vicinal samples are found to be cor
related with the different surface reconstructions. After deposition of Sb
at 260 degrees C and further annealing to 400 degrees C and 600 degrees C,
a nearly balanced ratio of (2 x 1):(1 x 2) domains for the singular sample
and a predominantly (2 x 1) reconstructed surface for the vicinal sample is
derived from RS, in agreement with LEED results. In contrast, after Sb dep
osition at 600 degrees C, a balanced ratio of (2 x 1) and (1 x 2) reconstru
cted domains is found for vicinal as well as for singular Si(001). (C) 2000
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