I. Doudevski et al., Atomic force microscope imaging of molecular aggregation during self-assembled monolayer growth, COLL SURF A, 174(1-2), 2000, pp. 233-243
Citations number
25
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS
'Self-assembled' monolayers of amphiphilic surfactant molecules form sponta
neously on solid surfaces by exposure to dilute solutions of the adsorbate
molecules. Using a combination of atomic force microscopy (AFM), infrared s
pectroscopy, and wettability studies, we find that these monolayers form vi
a a mechanism that includes nucleation, growth, coalescence, etc, of densel
y packed submonolayer islands of the long-chain organic molecules. AFM expe
riments permit direct observations of the size and shape of these islands.
Molecules that attach to each other covalently and irreversibly (such as al
kyltrichlorosilanes) form islands that are fractal with a morphology consis
tent with 2D diffusion-limited aggregation. Molecules that interact with ea
ch other via softer van der Waals interactions form rounded islands, sugges
ting that the island shapes relax via a continuous process of 2D desorption
and re-adsorption. In situ AFM measurements allow a quantitative analysis
of island nucleation and growth rates as well as determination of the islan
d size distribution as a function of coverage. In the growth regime, the nu
cleation and growth rates have a power law behavior consistent with a simpl
e point island model of 2D cluster growth. The exponents are consistent wit
h a critical nucleus of two molecules and the 2D diffusion coefficient corr
esponds to a 'hopping time' of about 1 mu s. In the aggregation regime, the
island size distributions are shown to scale with a single evolving length
scale in accordance with the dynamical scaling approximation. (C) 2000 Els
evier Science B.V. All rights reserved.