SPECTRAL MICROPHOTOLUMINESCENCE INVESTIGATION OF IMPURITY-DEFECT INTERACTION IN CDTE WITH HIGH-SPATIAL-RESOLUTION

Authors
GUKASYAN A KVIT A KLEVKOV Y KAZARYAN S
Citation
A. Gukasyan et al., SPECTRAL MICROPHOTOLUMINESCENCE INVESTIGATION OF IMPURITY-DEFECT INTERACTION IN CDTE WITH HIGH-SPATIAL-RESOLUTION, Materials science & engineering. B, Solid-state materials for advanced technology, 47(1), 1997, pp. 87-89
Citations number
7
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Materials science & engineering. B, Solid-state materials for advanced technology → ACNP
ISSN journal
09215107
Volume
47
Issue
1
Year of publication
1997
Pages
87 - 89
Database
ISI
SICI code
0921-5107(1997)47:1<87:SMIOII>2.0.ZU;2-R
Abstract
The microphotoluminescence (MPL) technique is applied to investigate t he behavior of residual impurities in the nearest vicinity of extended defects in polycrystalline CdTe. The MPL spectra variation is associa ted with impurity-defect interaction and their complex formation. The high purity of CdTe samples used in experiments helped to separate the influence of residual impurities, native defects and their complexes on MPL properties of the material. (C) 1997 Elsevier Science S.A.