Study of interface effects in thermoelectric microrefrigerators

Authors
Citation
Ys. Ju et U. Ghoshal, Study of interface effects in thermoelectric microrefrigerators, J APPL PHYS, 88(7), 2000, pp. 4135-4139
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
88
Issue
7
Year of publication
2000
Pages
4135 - 4139
Database
ISI
SICI code
0021-8979(20001001)88:7<4135:SOIEIT>2.0.ZU;2-2
Abstract
Interface phenomena play a vital role in thermoelectric (TE) microrefrigera tors. The present study employs a phenomenological model to examine the beh avior of TE refrigerators as a function of thermal and electrical contact r esistance, boundary Seebeck coefficient, and heat sink conductance. We modi fy the conventional definition of the figure of merit to capture the interf ace effects. A finite temperature drop across the interface between a metal electrode and a thermoelement is found to strongly influence the boundary Seebeck effect. Interface engineering can potentially improve the overall p erformance of TE microrefrigerators. (C) 2000 American Institute of Physics . [S0021-8979(00)08019-1].