Depth profiles of poly(vinyl chloride) (PVC) films chemically modified in s
olvent/non-solvent mixtures were obtained using confocal Raman microscopy (
CRM). The non-destructive technique allows the characterization of interpha
ses of up to 50 microns in thickness with a resolution of 1.4 mu m. The acc
uracy of CRM is demonstrated by comparison of mean degrees of modification
calculated from depth profiles and values obtained by transmission FTIR spe
ctroscopy.