Depth profiling of modified PVC surfaces using confocal Raman microspectroscopy

Citation
J. Sacristan et al., Depth profiling of modified PVC surfaces using confocal Raman microspectroscopy, MACRO RAPID, 21(13), 2000, pp. 894-896
Citations number
16
Categorie Soggetti
Organic Chemistry/Polymer Science
Journal title
MACROMOLECULAR RAPID COMMUNICATIONS
ISSN journal
10221336 → ACNP
Volume
21
Issue
13
Year of publication
2000
Pages
894 - 896
Database
ISI
SICI code
1022-1336(20000911)21:13<894:DPOMPS>2.0.ZU;2-0
Abstract
Depth profiles of poly(vinyl chloride) (PVC) films chemically modified in s olvent/non-solvent mixtures were obtained using confocal Raman microscopy ( CRM). The non-destructive technique allows the characterization of interpha ses of up to 50 microns in thickness with a resolution of 1.4 mu m. The acc uracy of CRM is demonstrated by comparison of mean degrees of modification calculated from depth profiles and values obtained by transmission FTIR spe ctroscopy.