Dynamics of vibrating atomic force microscopy

Citation
W. Van De Water et J. Molenaar, Dynamics of vibrating atomic force microscopy, NANOTECHNOL, 11(3), 2000, pp. 192-199
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
NANOTECHNOLOGY
ISSN journal
09574484 → ACNP
Volume
11
Issue
3
Year of publication
2000
Pages
192 - 199
Database
ISI
SICI code
0957-4484(200009)11:3<192:DOVAFM>2.0.ZU;2-8
Abstract
An atomic force microscope which is operated in the oscillating mode is an example of an impact oscillator. The description of such dynamical systems can be reduced to a mathematical mapping, which displays a square-root sing ularity. A direct consequence of this property is the emergence of an infin ite series of period-adding bifurcations. This extremely characteristic phe nomenon should be observed in atomic force microscopes. We consider an atom ic force microscope in which the tip-substrate forces are modelled by a liq uid-bridge interaction. By integrating the dynamical equations we show that the atomic force microscopy (AFM) dynamical behaviour has the same charact eristic bifurcation scenario as the square-root map. We point to the remark able role of the energy that is dissipated upon impact. We finally suggest ways to improve the operation of AFM.