Using direct illumination CCDs as high-resolution area detectors for X-rayscattering

The use of charge-coupled devices (CCDs) under direct illumination of X-ray s for two-dimensional position-sensitive detectors in high-resolution diffr action experiments is discussed. Two detectors are compared: a standard CCD and a "deep depletion" CCD. These give position resolution close to the pi xel size ( similar to 22 mu m), and energy resolution close to the theoreti cal resolution of a Si detector. These detectors can be used for photon-cou nting and an algorithm for electronic noise suppression is presented. This algorithm is useful for experiments with frequent readouts and low intensit y. Examples demonstrating the advantages of this algorithm for diffraction experiments are given. (C) 2000 Elsevier Science B.V. All rights reserved.