Piezoelectric potentials and carrier lifetimes in strain-induced quantum well dots

Citation
R. Virkkala et al., Piezoelectric potentials and carrier lifetimes in strain-induced quantum well dots, PHYS REV B, 62(11), 2000, pp. 6932-6935
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
62
Issue
11
Year of publication
2000
Pages
6932 - 6935
Database
ISI
SICI code
0163-1829(20000915)62:11<6932:PPACLI>2.0.ZU;2-O
Abstract
The piezoelectric effect and its influence on the electronic structure of s train-induced quantum dots has been analyzed by elastic continuum and k . p methods. The piezoelectric effect gives rise to side minima for electrons; and holes. These minima are located a few tens of nanometers apart from ea ch other and from the deformation-potential minima. The carriers confined i n these minima have radiative lifetimes that are 2 X 10(3) longer than the lifetime of carriers in the quantum dot ground state. Under quasiequilibriu m conditions confinement of a free electron and a hole in the piezominima i s energetically similar to 105 meV more favorable than exciton formation fo llowed by confinement in the deformation potential minima. This suggests th at with increasing photoexcitation intensity confinement of electrons and h oles in the piezominima will largely cancel the piezoelectric polarization of the structure.