Interpretation of "true atomic resolution" images of graphite (0001) in noncontact atomic force microscopy

Citation
H. Holscher et al., Interpretation of "true atomic resolution" images of graphite (0001) in noncontact atomic force microscopy, PHYS REV B, 62(11), 2000, pp. 6967-6970
Citations number
32
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
62
Issue
11
Year of publication
2000
Pages
6967 - 6970
Database
ISI
SICI code
0163-1829(20000915)62:11<6967:IO"ARI>2.0.ZU;2-U
Abstract
To examine the contrast formation by noncontact atomic force microscopy (NC -AFM), we simulate images of graphite (0001) and compare them with experime ntal results. Important features of the experimental data like the appearan ce of a trigonal structure with a distance of 2.46 Angstrom between the max ima and the experimental corrugation amplitudes are well reproduced. The de tailed analysis shows that the NC-AFM images reveal the positions of the ca rbon atoms as minima and the hollow sites as maxima, in contrast to a simpl e interpretation of NC-AFM data.