Ag. Belov et al., RELAXATION AND RECOMBINATION CHANNELS OF FORMATION OF LUMINESCENT STATES IN A NEON CRYSTAL - EVIDENCE OF ELECTRON SELF-TRAPPING, Low temperature physics, 23(4), 1997, pp. 322-328
The relation between the temperature and the intensity distribution in
luminescence bands in VUV and VIS spectral regions of Ne crystals is
investigated. The measurements are made by using cathodoluminescent sp
ectroscopy with steady-state excitation and are supplemented by observ
ations of luminescence decay in perfect pure crystals, in samples with
defects, and in solid solutions with electronegative (oxygen) and ele
ctropositive (xenon) impurities. The contribution of the recombination
channel to the formation of the spectrum of self-trapped states in so
lid neon is determined. It is shown that this channel plays a decisive
role in the population of 3p(3p') luminescence centers and makes a re
latively small contribution to the population of the lowermost 3s(3s')
excitations. The recombination channel efficiency strongly depends on
temperature, increasing abruptly with the temperature value. An analy
sis of experimental data leads to the conclusion on the possibility of
electron self-trapping in Ne cryocrystals, followed by the formation
of shallow self-trapped states. (C) 1997 American institute of Physics
.