Low-resolution phase extension using wavelet analysis

A method to extend low-resolution phases is presented which uses histogram matching not only of the electron density, but also of histograms obtained from the different levels of detail provided by the wavelet transform of th e electron density. Statistical values for the wavelet coefficients can be predicted and depend only on the resolution and solvent content. Therefore, new details can be added to an electron-density map by matching the values of the wavelet coefficients to those predicted for an increased resolution . The positions of the new details are also guided by the diffraction patte rn. In this way, the resolution can be increased gradually; on a number of trial structures of different size, solvent percentage and space group, it has been possible to extend the phasing from 10 Angstrom to around 6-7 Angs trom.